Analysis of Sensitivity Tests

Barry T. Neyer
EG&G Mound Applied Technologies
Miamisburg, OH 45343-3000

Contact Address
Barry T. Neyer
PerkinElmer Optoelectronics
1100 Vanguard Blvd
Miamisburg, OH 45342
(937) 865-5586
(937) 865-5170 (Fax)


A new method of analyzing sensitivity tests is proposed. It uses the Likelihood Ratio Test to compute regions of arbitrary confidence. It can calculate confidence regions for the parameters of the distribution (e.g., the mean, m, and the standard deviation, s) as well as various percentiles. Unlike presently used methods, such as those based on asymptotic analysis, it can analyze the results of all sensitivity tests, and it does not significantly underestimate the size of the confidence regions. The main disadvantage of this method is that it requires much more computation to calculate the confidence regions. However, these calculations can be easily and quickly performed on most computers.

Technical Papers of Dr. Barry T. Neyer

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