Reprinted from TECHNOMETRICS, February 1994, Vol 36, No 1, Pages 61-70. Updated with Additional Graphs and new address.

A D-Optimality-Based Sensitivity Test

Barry T. Neyer
EG&G Mound Applied Technologies
Miamisburg, OH 45343-3000

Contact Address
Barry T. Neyer
PerkinElmer Optoelectronics
1100 Vanguard Blvd
Miamisburg, OH 45342
(937) 865-5586
(937) 865-5170 (Fax)


Sensitivity tests are often used to estimate the parameters associated with latent continuous variables which cannot be measured. For example, each explosive specimen has a threshold. The specimen will detonate if and only if an applied shock exceeds this value. Since there is no way to determine the threshold of an individual, specimens are tested at various levels to determine parameters of the population. A new test described here produces efficient estimates of the parameters of the distribution, even with limited prior knowledge. This test efficiently characterizes the entire distribution and desired percentiles of any population.

Key Words: Bruceton method, Langlie method, Neyer method, Neyer D-Optimal method, Optimal design, Probit method

Technical Papers of Dr. Barry T. Neyer

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