Presented at the Sixteenth International Pyrotechnics Seminar, Jönköping, Sweden, June 1991

Sensitivity Testing and Analysis

Barry T. Neyer
EG&G Mound Applied Technologies
Miamisburg, OH

Contact Address
Barry T. Neyer
PerkinElmer Optoelectronics
1100 Vanguard Blvd
Miamisburg, OH 45342
(937) 865-5586
(937) 865-5170 (Fax)


New methods of sensitivity testing and analysis are proposed. The new test method utilizes Maximum Likelihood Estimates to pick the next test level in order to maximize knowledge of both the mean, m, and the standard deviation, s, of the population. Simulation results demonstrate that this new test provides better estimators (less bias and smaller variance) of both m and s than the other commonly used tests (Probit, Bruceton, Robbins-Monro, Langlie). A new method of analyzing sensitivity tests is also proposed. It uses the Likelihood Ratio Test to compute regions of arbitrary confidence. It can calculate confidence regions for m, s, and arbitrary percentiles. Unlike presently used methods, such as the program ASENT which is based on the Cramér-Rao theorem, it can analyze the results of all sensitivity tests, and it does not significantly underestimate the size of the confidence regions. The new test and analysis methods will be explained and compared to the presently used methods.

Technical Papers of Dr. Barry T. Neyer

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